6412 Us-75 Sherman, TX 75090
This exceptional 54.38-acre mixed-use land parcel presents a remarkable investment opportunity in Sherman, Texas. Strategically located on US-75N, this property boasts high visibility and convenient access to major transportation routes. The site is zoned for both retail (14.49 acres designated as C1 Retail Business District) and multifamily residential development (39.04 acres designated as R-2 Multi-Family Residential), offering flexibility for a diverse range of projects. The area is experiencing significant growth, with over eight active single-family and multi-family developments currently underway, indicating a strong and expanding market. This property benefits from its location within the City of Sherman and Howe ISD. A key advantage is its proximity to the future site of the substantial 30-billion-dollar Texas Instruments semiconductor fabrication plant, promising long-term economic growth and increased demand for housing and commercial spaces. All utilities are either on-site or readily accessible, simplifying development plans and reducing infrastructure costs. This presents a unique chance to capitalize on the burgeoning Sherman market and the immense potential spurred by the upcoming Texas Instruments facility. The property's size and zoning make it suitable for a large-scale development project, offering significant returns for investors seeking a prime location in a rapidly developing area. The address is 6412 US-75, Sherman, TX 75090.
Cap rate
Implied · in-place · derived from last sale + estimated NOIValue
AI, CAP & Alternative Use estimations · Realmo proprietary blendComparables
6 recent transactions · within 1.5 miComparable in this City
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Property description
Physical attributes from public recordsZoning & alternative use
No recorded transactions found for this property.
Costs & Benchmarks
Operating expenses, capex projections, utility benchmarks, and submarket comparables — all in one view.
Risks
Flood, climate, environmental, title, and tenant-concentration risk — surfaced with mitigations and source citations.